Zhongjie GUO, Nan LIU, Hu LU, et al., “Method of Single Event Effects Radiation Hardened Design for DC-DC Converter Based Load Transient Detection,” Chinese Journal of Electronics, vol. 33, no. 5, pp. 1154–1164, 2024. DOI: 10.23919/cje.2022.00.442
Citation: Zhongjie GUO, Nan LIU, Hu LU, et al., “Method of Single Event Effects Radiation Hardened Design for DC-DC Converter Based Load Transient Detection,” Chinese Journal of Electronics, vol. 33, no. 5, pp. 1154–1164, 2024. DOI: 10.23919/cje.2022.00.442

Method of Single Event Effects Radiation Hardened Design for DC-DC Converter Based Load Transient Detection

  • Aiming at the impact of load current change on single-event transient, the essential difference between single-event transient and load transient of DC-DC converter is deeply studied. A hardened circuit based on load transient detection is proposed. The circuit detects the load transient information in time and outputs a control signal to control the single event hardened circuit, thereby realizing the improvement of the transient characteristics of the system under dynamic conditions. Based on the 180 nm bipolar-CMOS-DMOS (BCD) process, the design and physical verification of a boost converter are completed. The experimental results show that the input voltage range is 2.9–4.5 V, the output voltage range is 5.8–7.9 V, and the load current is 0–55 mA. During load transients, the load detection circuit turns off the hardened circuit in time, avoiding system oscillation and widening the dynamic range of the hardening circuit. Under the single-event transient, the output voltage fluctuation of the system does not exceed the maximum ripple voltage, and the single-event transient suppression ability reaches more than 86%, the system can work well with linear energy transfer of about 100 MeV·cm2/mg.
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